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http://dx.doi.org/10.3745/KIPSTA.2011.18A.2.061

PinMemcheck: Pin-Based Memory Leakage Detection Tool for Mobile Device Development  

Jo, Kyong-Jin (고려대학교 전기전자전파공학과)
Kim, Seon-Wook (고려대학교 전기전자전파공학과)
Publication Information
The KIPS Transactions:PartA / v.18A, no.2, 2011 , pp. 61-68 More about this Journal
Abstract
Memory error debugging is one of the most critical processes in improving software quality. However, due to the extensive time consumed to debug, the enhancement often leads to a huge bottle neck in the development process of mobile devices. Most of the existing memory error detection tools are based on static error detection; however, the tools cannot be used in mobile devices due to their use of large working memory. Therefore, it is challenging for mobile device vendors to deliver high quality mobile devices to the market in time. In this paper, we introduce "PinMemcheck", a pin-based memory error detection tool, which detects all potential memory errors within $1.5{\times}$ execution time overhead compared with that of a baseline configuration by applying the Pin's binary instrumentation process and a simple data structure.
Keywords
Memory Error Detection Tool; Memory Leakage;
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Times Cited By KSCI : 3  (Citation Analysis)
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