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http://dx.doi.org/10.3745/KIPSTC.2010.17C.1.047

A Method of Statistical Randomness Test for Key Derivation Functions  

Kang, Ju-Sung (국민대학교 수학과)
Yi, Ok-Yeon (국민대학교 수학과)
Youm, Ji-Sun (국민대학교 수학과)
Cho, Jin-Woong (전자부품연구원)
Publication Information
The KIPS Transactions:PartC / v.17C, no.1, 2010 , pp. 47-60 More about this Journal
Abstract
Randomness is a basic security evaluation item for the most cryptographic algorithms. NIST has proposed a statistical test suit for random number generators for cryptographic applications in the process of AES project. However the test suit of NIST is customized to block ciphers which have the same input and output lengths. It needs to revise NIST's test suit for key derivation functions which have multiple output blocks. In this paper we propose a revised method of NIST's statistical randomness test adequate to the most key derivation functions and some experimental results for key derivation functions of 3GSM and NIST.
Keywords
Statistical Randomness Test; Key Derivation Function; Multiple Block Output Function;
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