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http://dx.doi.org/10.14248/JKOSSE.2015.11.1.067

A Study on the Promotion of Reliability Test for Imbedded Software of Weapon System  

Heo, Kon Yi (Korea Aerospace Research Institute)
Kwon, Kyoug Yong (Defense Agency for Technology and Quality)
Kim, Tae Sik (Defense Agency for Technology and Quality)
Publication Information
Journal of the Korean Society of Systems Engineering / v.11, no.1, 2015 , pp. 67-72 More about this Journal
Abstract
It has been tested for SW reliability in order to prevent the SW error during the development of weapons systems. According to a recent report, defects such as memory leak, buffer overflow, and null deference occur usually in the development stage, but also in the mass production stage. Although it is intended to enhance the SW test and evaluation to prevent SW failures in the development stage, the non-functional problems like syntax errors are not completely revised due to the limitation of the schedule and costs. In addition, SW failure rate are usually fluctuated by the operational environment through SW upgrade in contrast with HW. In this paper, we propose a method to increase SW reliability in the mass production stage of Korean weapon systems.
Keywords
SW Reliability Test; Static Analysis; Weapon System; Acquisition; Low Rate Initial Production;
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