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http://dx.doi.org/10.46670/JSST.2022.31.1.41

Constant Voltage Stress (CVS) and Hot Carrier Injection (HCI) Degradations of Vertical Double-date InGaAs TFETs for Bio Sensor Applications  

Baek, Ji-Min (School of Electronic and Electrical Engineering, Kyungpook National University)
Kim, Dae-Hyun (School of Electronic and Electrical Engineering, Kyungpook National University)
Publication Information
Journal of Sensor Science and Technology / v.31, no.1, 2022 , pp. 41-44 More about this Journal
Abstract
In this study, we have fabricated and characterized vertical double-gate (DG) InGaAs tunnel field-effect-transistors (TFETs) with Al2O3/HfO2 = 1/5 nm bi-layer gate dielectric by employing a top-down approach. The device exhibited excellent characteristics including a minimum subthreshold swing of 60 mV/decade, a maximum transconductance of 141 µS/㎛, and an on/off current ratio of over 103 at 20℃. Although the TFETs were fabricated using a dry etch-based top-down approach, the values of DIBL and hysteresis were as low as 40 mV/V and below 10 mV, respectively. By evaluating the effects of constant voltage and hot carrier injection stress on the vertical DG InGaAs TFET, we have identified the dominant charge trapping mechanism in TFETs.
Keywords
Bio sensor; Tunneling; TFET; InGaAs; Sub-thermal subthreshold swing; Reliability; CVS; HCI;
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