[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.5369/JSST.2016.25.5.326

Digital CMOS Temperature Sensor Implemented using Switched-Capacitor Circuits

Son, Bich (Department of Electronic Engineering, Chonbuk National Unversity College of Engineering, Chonbuk National University)
Park, Byeong-Jun (Department of Electronic Engineering, Chonbuk National Unversity College of Engineering, Chonbuk National University)
Gu, Gwang-Hoe (Department of Electronic Engineering, Chonbuk National Unversity College of Engineering, Chonbuk National University)
Cho, Dae-Eun (Major of Semiconductor Science and Technology, Chonbuk National Unversity College of Natural Science, Chonbuk National University)
Park, Hueon-Beom (Department of Electronic Engineering, Chonbuk National Unversity College of Engineering, Chonbuk National University)
Jeong, Hang-Geun (Department of Electronic Engineering, Chonbuk National Unversity College of Engineering, Chonbuk National University)

Publication Information

Journal of Sensor Science and Technology / v.25, no.5, 2016 , pp. 326-332 More about this Journal

Abstract

A novel CMOS temperature sensor with binary output is implemented by using fully differential switched-capacitor circuits for resistorless implementation of the temperature sensor core. Temperature sensing is based on the temperature characteristics of the pn diodes implemented by substrate pnp transistors fabricated using standard CMOS processes. The binary outputs are generated by using the charge-balance principle that eliminates the division operation of the PTAT voltage by the bandgap reference voltage. The chip was designed in a MagnaChip $0.35-{\mu}m$ CMOS process, and the designed circuit was verified using Spectre circuit simulations. The verified circuit was laid out in an area of $950{\mu}m{\times}557 {\mu}m$ and is currently under fabrication.

Keywords

Temperature sensor; CMOS; Switched-capacitor; Charge-balance; Sigma-delta modulation;

Citations & Related Records

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