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http://dx.doi.org/10.5369/JSST.2015.24.6.359

Algorithm of Modified Single-slope A/D Converter with Improved Conversion Time for CMOS Image Sensor System  

Lee, Sang-Hoon (School of Electronics Engineering, Kyungpook National Unversity)
Kim, Jin-Tae (School of Electronics Engineering, Kyungpook National Unversity)
Shin, Jang-Kyoo (College of IT Engineering, Kyungpook National Unversity)
Choi, Pyung (College of IT Engineering, Kyungpook National Unversity)
Publication Information
Journal of Sensor Science and Technology / v.24, no.6, 2015 , pp. 359-363 More about this Journal
Abstract
This paper proposes an algorithm that reduces the conversion time of a single-slope A/D converter (SSADC) that has n-bit resolution, which typically is limited by conversion time taking up to $2^n$ clock cycles for an operation. To improve this situation, we have researched a novel hybrid-type A/D converter that consists of a pseudo-pipeline A/D converter and a conventional SSADC. The pseudo-pipeline A/D converter, using a single-stage of analog components, determines the most significant bits (MSBs) or upper bits and the conventional SSADC determines the remaining bits. Therefore, the modified SSADC, similar to the hybrid-type A/D converter, is able to significantly reduce the conversion time because the pseudo-pipeline A/D converter, which determines the MSBs (or upper bits), does not rely on a clock. The proposed A/D converter was designed using a $0.35-{\mu}m$ 2-poly 4-metal standard complementary metal oxide semiconductor (CMOS) technology process; additionally, its characteristics were simulated.
Keywords
Single-slope A/D converter; Conversion time; Pipeline A/D converter; A/D converter; CMOS image sensor;
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1 M. Shin, M. Ikebe, J. Motohisa, and E. Sano, "Column parallel single-slope ADC with time to digital converter for CMOS imager", Proc. IEEE Conf. Electronics, Circuits, and Systems, pp. 863-866, Athens, Greece, 2010.
2 S. Lim, J. Lee, D. Kim, and G. Han, "A hige-speed CMOS image sensor with column-parallel two-step single-slope ADCs", IEEE Transactions on Electron Devices, Vol. 56, No. 3, pp. 393-398, 2009.   DOI
3 A. Mahdy, R. A. Rassoul, and N. Hamdy, "A high-speed analog comparator in $0.5{\mu}m$ CMOS technology", National Radio Science Conference NRSC 2008, pp. 1-7, Tanta, Egypt, 2008.
4 M. J. Cabebe, C. D. Gallego, J. R. Hizon, and L. Alarcon, "Design tradeoffs in a 0.5 V 65 nm CMOS folded cascade OTA", IEEE TENCON Spring Conf. 2013, pp. 293-297, Sydney, Australia, 2013.
5 C. H. Kuo, T. H. Kuo, and K. L. Wen, "Bias-and-input interchanging technique for cyclic/pipelined ADCs with opamp sharing", IEEE Transactions on Circuits and Systems II, Vol. 57, No. 3, pp. 168-172, 2010.   DOI
6 V. Coelho, C. Galup-Montoro, and M. Cherem Schneider. "A high-swing MOS cascade bias circuit", IEEE Transactions on Circuits and Systems II, Vol. 47, No. 11, pp. 1325-1328, 2000.   DOI
7 I. Y. Oh, J. H. Bang, and C. S. Park, "Dynamic bias circuit of CMOS power amplifier sensing dissipated signals", IET Electronics Letters, Vol. 45, No. 14, pp. 744-746, 2009.   DOI
8 K. B Klaassen, J. C. L. van Peppen, "A fast and unilateral monolithic switch for analog signals", IEEE Journal of Solid-State Circuits, Vol. 13, No. 2, pp. 258-261, 1978.   DOI