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http://dx.doi.org/10.5369/JSST.2014.23.5.332

High-Speed CMOS Binary Image Sensor with Gate/Body-Tied PMOSFET-Type Photodetector  

Choi, Byoung-Soo (School of Electronics Engineering, Kyungpook National University)
Jo, Sung-Hyun (School of Electronics Engineering, Kyungpook National University)
Bae, Myunghan (School of Electronics Engineering, Kyungpook National University)
Kim, Jeongyeob (Department of Sensor and Display Engineering, Kyungpook National University)
Choi, Pyung (School of Electronics Engineering, Kyungpook National University)
Shin, Jang-Kyoo (School of Electronics Engineering, Kyungpook National University)
Publication Information
Journal of Sensor Science and Technology / v.23, no.5, 2014 , pp. 332-336 More about this Journal
Abstract
In this paper, we propose a complementary metal oxide semiconductor (CMOS) binary image sensor with a gate/body-tied (GBT) PMOSFET-type photodetector for high-speed operation. The GBT photodetector of an active pixel sensor (APS) consists of a floating gate ($n^+$-polysilicon) tied to the body (n-well) of the PMOSFET. The p-n junction photodiode that is used in a conventional APS has a good dynamic range but low photosensitivity. On the other hand, a high-gain GBT photodetector has a high level of photosensitivity but a narrow dynamic range. In addition, the pixel size of the GBT photodetector APS is less than that of the conventional photodiode APS because of its use of a PMOSFET-type photodetector, enabling increased image resolution. A CMOS binary image sensor can be designed with simple circuits, as a complex analog to digital converter (ADC) is not required for binary processing. Because of this feature, the binary image sensor has low power consumption and high speed, with the ability to switch back and forth between a binary mode and an analog mode. The proposed CMOS binary image sensor was simulated and designed using a standard CMOS $0.18{\mu}m$ process.
Keywords
CMOS image sensor; Binary image; High speed; Gate/body-tied photodetector;
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1 M. Bae, S. H. Jo, M. Lee, J. Y. Kim, J. Choi, P. Choi, and J. K. Shin, "A wide dynamic range CMOS image sensor based on a pseudo 3-transistor active pixel sensor using feedback structure", J. Sensor Sci. & Tech., Vol. 21, No. 6, pp. 413-419, 2012.   과학기술학회마을   DOI   ScienceOn
2 N. Kawai and S. Kawahito, "Noise analysis of high-gain, low-noise column readout circuits for CMOS image sensors", IEEE Trans. Electron Devices, Vol. 51, No. 2, pp. 185-194, 2004.   DOI   ScienceOn
3 C. S. Hong and R. Hornsey, "On-chip binary image processing with CMOS image sensor", Proc. SPIE, Vol. 4669, pp. 125-136, 2002.
4 B. Zhang, K. Mei, and N. Zheng, "Reconfigurable processor for binary image processing", IEEE Trans. Biomed. Circuits Syst., Vol. 5, pp. 64-82, 2013.
5 N. Tanaka, T. Ohmi, and Y. Nakamura, "A novel bipolar imaging device with self noise reduction capability", IEEE Trans. Electron Devices, Vo. 36, pp. 31-38, 1989.   DOI   ScienceOn
6 K. Yonemoto and H. Sumi, "A CMOS image sensor with a simple fixed-pattern-noise-reduction technology and a hole accumulation diode," IEEE J. Solid-State Circuits, Vol. 35, No. 12, pp.2038-2043, 2000.   DOI   ScienceOn
7 R. M. Guidash, T. H. Lee, P. P. K. Lee, D. H. Sackett, C. I. Drowley, M. S. Swenson, L. Arbaugh, R. Hollstein, F. Shapiro, and S. Domer, "A 0.6 im CMOS pinned photodiode color imager technology", IEDM Technical Digest, pp. 927-929, 1997.
8 I. Brouk, K. Alameh, and Y. Nemirovsky, "Design and characterization of CMOS/SOI image sensors", IEEE Trans. Electron Devices, Vol. 54, No. 3, pp. 468-475, 2007.   DOI
9 S. H. Seo, S. H. Lee, M. Y. Do, J. K. Shin, and P. Choi, "Highly and variably sensitive complementary metal oxide semiconductor active pixel sensor using P-channel metal oxide semiconductor field effect transistor-type photodetector with transfer gate", Jpn. J. Appl. Phys., Vol. 45, No. 4B, pp. 3470-3474, 2006.   DOI
10 S. H. Seo, K. D. Kim, M. W. Seo, J. S. Kong, J. K. Shin, and P. Choi, "Optical characteristics of an n-well/gate-tied PMOSFET-type photodetector with built-in transfer gate for CMOS image sensor", Sens. Mater., Vol. 19, No. 7, pp. 435-444, 2007.
11 M. Bigas, E. Cabruja, J. Forest, and J. Salvi, "Review of CMOS image sensors", Microelectronics J., Vol. 37, No. 2, pp. 433-451, 2006.   DOI   ScienceOn
12 M. Furuta, Y. Nishikawa, T. Inoue, and S. Kawahito, "A high-speed, high-sensitivity digital CMOS image sensor with a global shutter and 12-bit column-parallel cyclic A/D converters," IEEE J. Solid-State Circuits, Vol. 42, No. 4, pp. 766-774, 2007.   DOI   ScienceOn
13 R. H. Nixon, S. E. Kemeny, B. Pain, C.O. Staller, and E.R. Fossum, "256 ${\times}$ 256 CMOS active pixel sensor camera-on-a-chip", IEEE J. Solid-State Circuits, Vol. 31, No. 12, pp. 2046-2050, 1996.   DOI   ScienceOn
14 N. Stevanovic, M. Hillegrand, B. J. Hostica and A. Teuner, "A CMOS image sensor for high-speed imaging", IEEE International Solid-State Circuits Conference, pp. 104-105, 2000.
15 S. Mendis, Sabrina E. Kemeny, and Eric R. Fossum, "CMOS active pixel image sensor", IEEE Trans. Electron Devices, Vol. 41, No. 3, pp. 452-453, 1994.   DOI   ScienceOn
16 Y. Ardeshirpour, M. J. Deen, and S. Shirani, "2-D CMOS based Image sensor system for fluorescent detection", Canadian Conference on Electrical and Computer Engineering, Vol. 3, pp. 1441-1444, 2004.
17 E. Fossum, "CMOS image sensors: Electronic camera on a chip", IEEE Trans. Electron Devices, Vol. 44, No. 10, pp. 1689-1698, 1997.   DOI   ScienceOn