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http://dx.doi.org/10.23087/jkicsp.2022.23.2.008

3D Film Image Inspection Based on the Width of Optimized Height of Histogram  

Jae-Eun Lee (Div. of Computer Engineering, Pukyong National University)
Jong-Nam Kim (Div. of Computer Engineering, Pukyong National University)
Publication Information
Journal of the Institute of Convergence Signal Processing / v.23, no.2, 2022 , pp. 107-114 More about this Journal
Abstract
In order to classify 3D film images as right or wrong, it is necessary to detect the pattern in a 3D film image. However, if the contrast of the pixels in the 3D film image is low, it is not easy to classify as the right and wrong 3D film images because the pattern in the image might not be clear. In this paper, we propose a method of classifying 3D film images as right or wrong by comparing the width at a specific frequency of each histogram after obtaining the histogram. Since, it is classified using the width of the histogram, the analysis process is not complicated. From the experiment, the histograms of right and wrong 3D film images were distinctly different, and the proposed algorithm reflects these features, and showed that all 3D film images were accurately classified at a specific frequency of the histogram. The performance of the proposed algorithm was verified to be the best through the comparison test with the other methods such as image subtraction, otsu thresholding, canny edge detection, morphological geodesic active contour, and support vector machines, and it was shown that excellent classification accuracy could be obtained without detecting the patterns in 3D film images.
Keywords
3D film image; classification; histogram; image processing; width of histogram;
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Times Cited By KSCI : 1  (Citation Analysis)
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