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Aberration Retrieval Algorithm of Optical Pickups Using the Extended Nijboer-Zernike Approach  

Jun, Jae-Chul (한국소니전자)
Chung, Ki-Soo (경상대학교 물리학과)
Lee, Gun-Kee (경상대학교 전자공학과, 자동화 컴퓨터 연구센터)
Publication Information
Journal of the Institute of Convergence Signal Processing / v.11, no.1, 2010 , pp. 32-40 More about this Journal
Abstract
In this work, the method of acquiring the pupil function of optical system is proposed. The wavefront aberration and the intensity distribution of pupil can be analysed with the pupil function. This system can be adopted to the manufacturing line of optical pickup directly and also has good performance to analysing various property of optical instrument. It is one kind of inverse problem to get pupil functions by 3D beam data. The extended Nijboer-Zernike(ENZ) approach recently proposed by Netherlands research group is adopted to accompany to solve these inverse problem. The ENZ approach is one of a aberration retrieval method for which numerous approaches are available. But this approach is new in the sense that it use the highly efficient representation of pupil functions by means of their Zernike coefficients. These coefficients are estimated by using matching procedure in the focal region the theoretical 3D intensity distribution and measured 3D intensity distribution. The algorithm that can be applied more general circumstance such as high-numerical aperture instrument is developed by modifying original ENZ approach. By these scheme, MS windows based GUI program is developed and the good performance is verified with generated 3D beam data.
Keywords
aberration retrieval method; optical disk; Blu-ray disk; Nijboer-Zernike approach;
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