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http://dx.doi.org/10.6109/jkiice.2015.19.2.401

Analysis of Subthreshold Swing for Channel Length of Asymmetric Double Gate MOSFET  

Jung, Hakkee (Department of Electronic Engineering, Kunsan National University)
Abstract
The change of subthreshold swing for channel length of asymmetric double gate(DG) MOSFET has been analyzed. The subthreshold swing is the important factor to determine digital chracteristics of transistor and is degraded with reduction of channel. The subthreshold swing for channel length of the DGMOSFET developed to solve this problem is investigated for channel thickness, oxide thickness, top and bottom gate voltage and doping concentration. Especially the subthreshold swing for asymmetric DGMOSFET to be able to be fabricated with different top and bottom gate structure is investigated in detail for bottom gate voltage and bottom oxide thickness. To obtain the analytical subthreshold swing, the analytical potential distribution is derived from Possion's equation, and Gaussian distribution function is used as doping profile. As a result, subthreshold swing is sensitively changed according to top and bottom gate voltage, channel doping concentration and channel dimension.
Keywords
asymmetric double gate; threshold voltage; Poisson equation; channel length;
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Times Cited By KSCI : 1  (Citation Analysis)
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1 S. Dimitrijev, Principles of Semiconductor Devices, Oxford University Press, NewYork, 2012.
2 J.P.Duarte, S.J.Choi, D.I.Moon and Y.K.Choi, "A nonpiecewise model for long-channel junctionless cylindrical nanowire FETs," IEEE Electron Device Letters, vol.33, no.2, pp.155-157, 2012.   DOI   ScienceOn
3 R.Vaddi, S.Dasgupta and R.P.Agarwal,"Analytical modeling of subthreshold current and subthreshold swing of an underlap DGMOSFET with tied independent gate and symmetric asymmetric options," Microelectronics J., vol.42, no.5, pp.798-807, 2011.   DOI   ScienceOn
4 N.Seoane, G.Indalecio, E.Comesane, M.Aldegunde, A.J.Garcia-Loureiro and K.Kalna,"Random Dopant, Line-Edge Roughness and Gate Workfunction Variability in a Nano InGaAs FinFETs," IEEE Trans. on Electron Devices, vol. 61, no.2, pp.466-472, 2006.   DOI
5 J.B.Roldan, B.Gonzalez, B.Iniguez, A.M.Roldan, A.Lazaro and A.Cerdeira, "In-depth analysis and modelling of self-heating effects in nanometric DGMOSFETs," Solidstate electronics, vol.79, no.1, pp.179-184, 2013.   DOI   ScienceOn
6 Z.Ding, G.Hu, J.Gu, R.Liu, L.Wang and T.Tang,"An analytical model for channel potential and subthreshold swing of the symmetric and asymmetric double-gate MOSFETs," Microelectronics J., vol.42, pp.515-519, 2011.   DOI   ScienceOn
7 P.K.Tiwari, S.Kumar, S.Mittal, V.Srivastava and U.Pandey, "A 2D Analytical Model of the Channel Potential and Threshold Voltage of Double-Gate(DG) MOSFETs With Vertical Gaussian Doping Profile," IMPACT-2009, pp.52-55, 2009.
8 Hakkee Jung, :Analysis for Potential Distribution of Asymmetric Double Gate MOSFET Using Series Function, J. of KIICE, vol.17, no.11, pp.2621-2626, 2013.