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http://dx.doi.org/10.6109/jkiice.2014.18.12.3079

An Experimental Analysis for a High Pulse Radiation Induced Latchup Conformation  

Lee, Nam-Ho (Korea Atomic Energy Research Institute)
Hwang, Young-Gwan (Korea Atomic Energy Research Institute)
Jeong, Sang-Hun (Korea Atomic Energy Research Institute)
Kim, Jong-Yeol (Korea Atomic Energy Research Institute)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.18, no.12, 2014 , pp. 3079-3084 More about this Journal
Abstract
When an integrated circuit device is burned out under high-intense radiation and device-level simulation that usually requires manufacturer's proprietary information is not available, experimental conformation of a failure mechanism is often the only choice. To distinguish Latchup from other causes experimentally, a new combination of multiple techniques have been developed and demonstrated. Power supply circumvention, hot-spot monitoring using an infrared camera, and supply current monitoring techniques were implemented for the conformation of the Latchup.
Keywords
Pulse radiation; Latchup; Dose rate; Photocurrent; Burnout;
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