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http://dx.doi.org/10.6109/jkiice.2013.17.3.672

Breakdown Voltages Deviation for Channel Dimension of Double Gate MOSFET  

Jung, Hakkee (군산대학교)
Abstract
This paper have analyzed the change of breakdown voltage for channel dimension of double gate(DG) MOSFET. The breakdown voltage to have the small value among the short channel effects of DGMOSFET to be next-generation devices have to be precisely analyzed. The analytical solution of Poisson's equation have been used to analyze the breakdown voltage, and Gaussian function been used as carrier distribution to analyze closely for experimental results. The breakdown voltages have been analyzed for device parameters such as channel thickness and doping concentration, and projected range and standard projected deviation of Gaussian function. Since this potential model has been verified in the previous papers, we have used this model to analyze the breakdown voltage. As a result, we know the breakdown voltage is influenced on Gaussian function and device parameters for DGMOSFET.
Keywords
DGMOSFET; breakdown voltage; Gaussian function; short channel effect; Poisson equation; channel dimension;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
1 H. K. Jung,"Analysis of Doping Profile Dependent Threshold Voltage for DGMOSFET Using Gaussian Function," International Journal of KIMICS, Vol. 9, No. 3, pp. 310-314, 2011.
2 A. J. Garcia, N.Seoane, M.Aldegunde and R.Valin, "Implementation of the Density Gradient Quantum Correction for 3-D Simulations of Multigate Nanoscaled Transistors,"IEEE Trans. CAD of IC and Systems, Vol. 30, No. 6, pp. 841-851, 2011.   DOI   ScienceOn
3 D. S. Havaldar, G. Katti, N. DasGupta and A. DasGupta, "Subthreshold Current Model of FinFETs Based on Analytical Solution of 3-D Poisson's Equation," IEEE Trans. Electron Devices, Vol. 53, No. 4, pp. 737-741, 2006.   DOI   ScienceOn
4 P. K. Thakur and S. Mahapatra,"Large- Signal Model for Independent DG MOSFET,"IEEE Trans. Electron Devices, Vol. 58, No. 1, pp. 46-52, 2011.   DOI   ScienceOn
5 P. K. Tiwari, S. Kumar, S. Mittal, V. Srivastava, U. Pandey and S. Jit, "A 2D Analytical Model of the Channel Potential and Threshold Voltage of Double-Gate(DG) MOSFETs with Vertical Gaussian Doping Profile," IMPACT-2009, pp. 52-55, 2009.
6 W. Fulop,"Calculation of Avalanche Breakdown Voltages of Silicon p-n Junctions," Solid-State Electronics, Vol. 10, pp. 39-43, 1967   DOI   ScienceOn
7 H. K. Jung,"Subthreshold Characteris- tics of Double Gate MOSFET for Gaussian Function Distribution,"J. KIICE, Vol. 16, No. 6, pp. 1260-1265, 2012.
8 H. K. Jung,"The Analysis of Breakdown Voltage for the Double-gate MOSFET Using the Gaussian Doping Distribution," J. Inf. Commun. Converg. Eng., Vol. 10, No. 2, pp. 200-204, 2012.