Comparative Analysis of PBTI Induced Device Degradation in Junctionless and Inversion Mode Multiple-Gate MOSFET |
Kim, Jin-Su
(인천대학교 전자공학과)
Hong, Jin-Woo (인천대학교 전자공학과) Kim, Hye-Mi (인천대학교 전자공학과) Lee, Jae-Ki (가천대학교 전자공학과) Park, Jong-Tae (인천대학교 전자공학과) |
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