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http://dx.doi.org/10.6109/jkiice.2012.16.10.2329

A Study on Implementation of Transient Radiation Effects on Electronics(TREE) Assessment System  

Lee, Nam-Ho (한국원자력연구원)
Hwang, Young-Gwan (한국원자력연구원)
Kim, Jong-Ryul (한국원자력연구원)
Jeong, Sang-Hun (한국원자력연구원)
Oh, Seung-Chan (한국원자력연구원)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.16, no.10, 2012 , pp. 2329-2334 More about this Journal
Abstract
In this paper, we performed a study of damage assessment model development to analyze the initial nuclear pulse radiation damage to semiconductor devices for military weapon systems. At first we modeled(M) the nuclear pulse radiation and diode device, and simulated(S) the output characteristics of the device to the input. Then the manufactured diodes which had the same characteristics with the modeled one were irradiated to the similar pulsed type radiation and their output signals were measured simultaneously. Error between the M & S results and the measured values of the analysis was 22.9%. Through the error value we could confirm that the damage assessment model simulated the TREE effects with a quite accuracy.
Keywords
Pulse Radiation; Damage Effect; Assessment System; Analysis Model; Gamma-Radiation; Dose rate;
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