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http://dx.doi.org/10.6109/jkiice.2011.15.1.009

Measurement of the planar substrate dielectric constant using a microstrip line  

Han, Dae-Hyun (동의대학교 전자공학과)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.15, no.1, 2011 , pp. 9-15 More about this Journal
Abstract
This paper suggested the fast and easy method of the dielectric constant measurement for planar dielectrics using a microstrip line. The complex permittivity and permeability were presented by the first reflection and transmission coefficient which were derived from the scattering parameters. This method was verified by the measurement of a known planar dielectric using a microstrip line. This method can be applied to the dielectric constant measurement of unknown planar dielectric.
Keywords
dielectric constant measurement; microstrip line; scattering parameter; planar substrate;
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