Browse > Article
http://dx.doi.org/10.6109/jkiice.2010.14.3.707

Pseudo Random Pattern Generator based on phase shifters  

Cho, Sung-Jin (부경대학교 응용수학과)
Choi, U-Sook (동명대학교 미디어공학과)
Hwang, Yoon-Hee (부경대학교 정보보호학과)
Abstract
Since an LFSR(linear feedback shift register) as a pattern generator has solely linear dependency in itself, it generates sequences by moving the bit positions for pattern generation. So the correlation between the generated patterns is high and thus reduces the possibility of fault detection. To overcome these problems many researchers studied to have goodness of randomness between the output test patterns. In this paper, we propose the new and effective method to construct phase shifter as PRPG(pseudo random pattern generator).
Keywords
Phase shifter; Phase shift; LFSR; BIST; PRPG;
Citations & Related Records
연도 인용수 순위
  • Reference
1 D. Kagaris, "A Unified Method for Phase Shifter Computation," ACM Trans. on Des. Auto. Electron. Syst., vol. 10, no. 1, pp. 157-167, 2005.   DOI   ScienceOn
2 J. Kakade and D. Kagaris, "Minimization of Linear Dependencies Through the Use of Phase Shifters," IEEE Trans. Computer-Aided Design of Int. Circuits and Systems, vol. 26, no. 10, pp. 1877-1882, 2007.   DOI   ScienceOn
3 P.H. Bardell, "Design Considerations for Parallel Pseudorandom Pattern Generators," J. Electronic Testing: Theory and Applications, vol. 1, no. 1, pp. 73-87, 1990.   DOI
4 G. Mrugalski, J. Rajski and J. Tyszer, "High performance dense ring generators," Computers, IEEE Trans., vol. 55, no. 1, pp. 83-87, 2006.   DOI   ScienceOn
5 J. Rajski, N. Tamarapalli and J. Tyszer, "Automated Synthesis of Phase Shifters for Built-In Self-Test Applications," IEEE Trans. Computer-Aided Design, vol. 19, no. 10, pp. 1175-1188, 2000.   DOI   ScienceOn
6 P.H. Bardell and W.H. McAnney, "Pseudo- random arrays for built-in tests," IEEE Trans. Comput., vol. C-35, no. 7, pp.653-658, 1986.   DOI   ScienceOn
7 C. Dufaza and Y. Zorian, "On Some Theoretical Properties of LFSRs for BIST Applications," Proc. Int'l On-Line Testing Workshop, pp. 184-189, 1997.
8 J. Rajski and J. Tyszer, "Design of phase shifters for BIST applications," in Proc. VLSI Test Symp., pp. 218-224, 1998.
9 K. Hatayama, M. Nakao, Y. Kiyoshige and K. Natsume, "Application of High-Quality Built-In Test to Industrial Designs," Proc. Int'l Test Conf., pp. 1003-1012, 2002.
10 G. Mrugalski, J. Rajski and J. Tyszer, "Ring Generators-New Devices for Embedded Test Applications," IEEE Trans. Computer-Aided Design, vol. 23, no. 9, pp. 1306-1320, 2004.   DOI   ScienceOn
11 J. Kakade and D. Kagaris, "Phase shifts and linear dependencies," Circuits and Systems, ISCAS 2006. Proc. pp.1595-1598, 2006.