1 |
S. S. Osofsky and S. E. Schwarz, "A non-contacting probe for measurements on high-frequency planar circuits," IEEE MTT-S Dig., pp. 823-825, 1989
|
2 |
A. Hochman, P. Paneah, and Y. Leviatan, "Interaction between a waveguide-fed .narrow slot and a nearby conducting strip in millimeter-wave scanning microscopy," J. Appl Phys., vol. 88, pp. 5987-5992, 2000
DOI
ScienceOn
|
3 |
J. I. Lee, J. H. Ko, and Y. K. Cho, "Coupling through a slit in a flanged parallel plate waveguide with a conducting strip," Proc ISAP, pp. 589-592, 2004
|
4 |
Y. Gao and I. Wolff, "Miniature electric near-field probes for measuring 3-D fields in planar microwave circuits," IEEE Trans Microwave Theory Tech., vol. 46, pp. 907-913, 1998
DOI
ScienceOn
|
5 |
J. M. Vigoureux, F. Depasse, and C. Girard, "Superresolution of near-field optical microscopy defined from properties of confined electromagnetic waves," Appl Optics, vol. 31, pp. 3036-3045, 1992
DOI
|
6 |
J. S. Dahele and A. L. Cullen, "Electric probe measurements on microstrip," IEEE Trans Microwave Theory Tech., vol. 28, pp. 752-755, 1980
DOI
|
7 |
C. M. Butler et aI., "Flanged parallel-plate waveguide coupled to a conducting cylinder," Proc. lEE, pt. H, vol. 138, pp. 549-559, 1991
|
8 |
E. A. Ash and G. N. Nicholls, 'Super-resolution aperture scanning microscope,' Nature, vol. 237, pp. 510-512,1972
DOI
ScienceOn
|
9 |
J. I. Lee, K. W. Kim, and Y. K. Cho, "Equivalent admittance of a slit fed by a flanged parallel-plate waveguide and maximum coupling mechanism through a narrow slit," JKIEES, vol. 15, no. 11, pp. 1-8, Nov. 2004
|
10 |
J. I. Lee and Y. K. Cho, 'Maximum coupling phenomena through a slit fed by a flanged parallel-plate waveguide with a conducting strip,' JKIEES, vol. 17, no. 6, pp. 501-510, June 2006
과학기술학회마을
ScienceOn
|