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http://dx.doi.org/10.6109/JKIICE.2009.13.11.2260

A Study on the Coupling of a Flanged Parallel-Plate Waveguide to a Nearby Conducting Strip from the Viewpoint of Near-Field Scanning Microscopy  

Lee, Jong-Ig (동서대학교 전자공학과)
Ko, Ji-Hwan (금오공과대학교 전자공학부)
Cho, Young-Ki (경북대학교 전자전기컴퓨터학부)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.13, no.11, 2009 , pp. 2260-2266 More about this Journal
Abstract
In this paper, the problem of electromagnetic coupling between a slit fed by a flanged parallel-plate waveguide (FPPW) and a nearby conducting strip parallel to the slit is studied as a simplified problem for a near-field scanning microscopy (NSM). The characteristics of the FPPW are investigated from the results for the variations of the equivalent slit admittance, the reactive powers near the slit inside and outside the FPPW, the magnitude and phase of the voltage reflection coefficient of the TEM wave. The performance of the proposed apparatus as an NSM is tested by examining the effects of various geometrical parameters such as guide height, slit width, strip width, distance between slit and strip, and the ratio of slit width to guide height on the magnitude and phase of the voltage reflection coefficient of the TEM wave. From the results for the voltage reflection coefficient against the strip offset from the slit, it is found that a slit in the FPPW with smaller guide height gives higher scanning resolution and the phase variation is more sensitive than the magnitude variation.
Keywords
Coupling; flanged parallel-plate waveguide(FPPW); conducting strip; near-field scanning microscopy(NSM);
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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