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http://dx.doi.org/10.6109/jkiice.2008.12.2.299

Band Fault Modelling Based on specification for the Time Domain Test of RFIC  

Kim, Kang-Chul (전남대학교 공학대학 전기전자통신컴퓨터공학부)
Han, Seok-Bung (경상대학교 공과대학 전자공학과)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.12, no.2, 2008 , pp. 299-308 More about this Journal
Abstract
This paper proposes a new design specification-based band fault modelling technique that can test design specification in a time domain. The band fault model is defined and the conditions of band fault model are gained as normal operation regions are defined. And the conditions of band fault model are used in a 5.25GHz low noise amplifier, then 9 band fault models that can detect hard and parametric faults of active and passive devices are obtained.
Keywords
Band fault model; RFIC; Time domain; Design specification; Normal operation region; Hard fault; Parametric fault; Low noise amplifier;
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