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Development of Visual Inspection System for a CoG  

Jeong Jong-Myeon (목포해양대학교 해양전자통신공학부)
Kim Chi-Yeon (목포해양대학교 해양전자통신공학부)
Abstract
In this paper, we present a visual inspection system for a CoG using statistical features. After rotational error of an input image is compensated using Hough transformation, an inspection area is obtained by using projection method. Then the final result is derived from statistical features of segmented pad areas.
Keywords
visual inspection; statistical feature; Chip on Glass;
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1 R. T. Chin, C. A. Harlow, 'Automated visual inspection: a survey,' IEEE Trans. PAMI, Vol. 4, No.6, pp557-573, 1982
2 T. S. Newman, A. K. Jain, 'A Survey of automated visual inspection,' Compu. Visual Image Undrestanding 61, pp. 231-262,1995   DOI   ScienceOn
3 S. L. Bartlet, P. J. Besl, C. L. Cole, R. Jain, D. Mukherjee, K. D. Skifstad, 'Automatic solder joint inspection,' IEEE Trans. PAMI, Vol 10, No.1, pp.31-41, 1988   DOI   ScienceOn
4 R. A. Zoroofi, H. Taketani, S. Tamura, 'Automated inspection of IC wafer contamination,' Pattern Recognition, Vol. 34, pp. 1307-1317,2001   DOI   ScienceOn
5 J. L. Devore, Probability and Statistics for Engineering and the Sciences, Brooks/Cole Publishing Company, Pacific Grove, California, 1991
6 T. Surnimoto, T. Maruyama, Y. Azuma, S. goto, M. Mondou, N. Furukawa, S. Okada, ' Development of image analysis for detection of defects of BGA by using X-ray images,' Proc. of Instrumentation and Measurement Technology Conf., vol. 2, pp. 1131-1136, 2003
7 R. C. Gonzalez. R. E. Woods, Digital Image Processing, Prentice Hall, Upper Saddle River, New Jersey, 1992
8 T. H. Kim, T. H. Cho, Y. S. Moon, S. H. Park, 'Visual inspection system for the classification of solder joints,' Pattern Recognition, Vol. 32, pp. 565-575, 1999   DOI   ScienceOn