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Coverage metrics for high-level events in behavioral model verification  

Kim, Kang-Chul (전남대학교 공학대학 컴퓨터공학과)
Im, Chang-Gyun (전남대학교 공학대학 컴퓨터공학과)
Ryu, Jae-Hung (전남대학교 공학대학 컴퓨터공학과)
Han, Suk-Bung (경상대학교 공과대학 전자공학과)
Abstract
The complexity of IC has rapidly increased as VLSI fabrication technology has grown up quickly. This paper proposes verification methods for data conflicts and protocol between IPs for SoC with coverage metrics. The high-level events is defined to cooperation between blocks or process statement in HDL, or a sequence of performing a job compared to low-level event. They are classified into two categories, resource conflicts and protocol or specification-dependent conflicts. And two coverage metrics used for code coverage in low-level event are proposed to verify the hish-level events. The events of resource conflicts can be detected by using statement coverage metric if global signal or variable has flags in a testbench program, and protocol-dependent events can be checked by data flow metric or path metric.
Keywords
Coverage metric; Low-level event; High-level event; SOC; IP;
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