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http://dx.doi.org/10.5658/WOOD.2015.43.1.43

Wood Shrinkage Measurement of Using a Flatbed Scanner  

Park, Yonggun (Department of Forest Sciences, College of Agriculture & Life Sciences, Seoul National University)
Chang, Yoon-Seong (Department of Forest Sciences, College of Agriculture & Life Sciences, Seoul National University)
Yang, Sang-Yun (Department of Forest Sciences, College of Agriculture & Life Sciences, Seoul National University)
Yeo, Hwanmyeong (Department of Forest Sciences, College of Agriculture & Life Sciences, Seoul National University)
Lee, Mi-Rim (National Instrumentation Center for Environmental Management, Seoul National University)
Eom, Chang-Deuk (Department of Forest Products, Korea Forest Research Institute)
Kwon, Ohkyung (National Instrumentation Center for Environmental Management, Seoul National University)
Publication Information
Journal of the Korean Wood Science and Technology / v.43, no.1, 2015 , pp. 43-51 More about this Journal
Abstract
Wood shrinkage, an important study subject with regard to the use of wood, has long been studied by researchers. However, when the size of a wood specimen is measured, distortion must be taken into account, which can be accomplished by applying external force on the wood specimen. However, when measuring a large number of specimens, this technique can be a lengthy process. If the size is measured and the shrinkage is calculated from images acquired with a flatbed scanner, it is possible to reduce the error in the measurement and to shorten the measurement time because the images of many specimens can be acquired with one scan. To clearly establish the boundary between a wood specimen and the background in a scan, an image threshold method was applied here. The size of a wood specimen measured by means of a scanner image was found to be longer than the value determined with a vernier caliper. The maximum pixel size of a scan image for highly accurate shrinkage calculations compared with the use of a vernier caliper was 0.053 mm/pixel.
Keywords
shrinkage; image analysis; flatbed scanner; threshold;
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Times Cited By KSCI : 2  (Citation Analysis)
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