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http://dx.doi.org/10.4218/etrij.13.0213.0346

Analysis of Failure in Miniature X-ray Tubes with Gated Carbon Nanotube Field Emitters  

Kang, Jun-Tae (Creative Future Research Laboratory, ETRI, Department of Physics, Kyungpook National University)
Kim, Jae-Woo (Creative Future Research Laboratory, ETRI, School of Advanced Device Engineering, UST)
Jeong, Jin-Woo (Creative Future Research Laboratory, ETRI)
Choi, Sungyoul (Creative Future Research Laboratory, ETRI)
Choi, Jeongyong (Creative Future Research Laboratory, ETRI)
Ahn, Seungjoon (Creative Future Research Laboratory, ETRI, Department of Information Display, Sun Moon University)
Song, Yoon-Ho (Creative Future Research Laboratory, ETRI, School of Advanced Device Engineering, UST)
Publication Information
ETRI Journal / v.35, no.6, 2013 , pp. 1164-1167 More about this Journal
Abstract
We correlate the failure in miniature X-ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X-ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X-ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X-ray tubes.
Keywords
Carbon nanotube; field emission; triode; miniature X-ray tube; charging;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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