Temperature-Adaptive Back-Bias Voltage Generator for an RCAT Pseudo SRAM
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Son, Jong-Pil
(Memory Division, Samsung Electronics Corporation)
Byun, Hyun-Geun (Department of Semiconductor, SSIT, Samsung Electronics Corporation) Jun, Young-Hyun (Memory Division, Samsung Electronics Corporation) Kim, Ki-Nam (Memory Division, Samsung Electronics Corporation) Kim, Soo-Won (Department of Electronics Engineering, Korea University) |
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