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http://dx.doi.org/10.4218/etrij.10.0209.0285

Measurement Accuracy of Oscillation-Based Test of Analog-to-Digital Converters  

Mrak, Peter (Computer Systems Department, Jozef Stefan Institute)
Biasizzo, Anton (Computer Systems Department, Jozef Stefan Institute)
Novak, Franc (Computer Systems Department, Jozef Stefan Institute)
Publication Information
ETRI Journal / v.32, no.1, 2010 , pp. 154-156 More about this Journal
Abstract
Oscillation-based testing of analog-to-digital converters represents a viable option for low-cost built-in self-testing in mixed-signal design. While numerous papers have addressed implementation issues, little attention has been paid to the measurement accuracy. In this letter, we highlight an inherent measurement uncertainty which has to be considered when deriving the parameters from the oscillation frequency.
Keywords
mixed-signal test; analog-to-digital converter (ADC); oscillation-based test (OBT); measurement accuracy;
Citations & Related Records

Times Cited By Web Of Science : 2  (Related Records In Web of Science)
Times Cited By SCOPUS : 4
연도 인용수 순위
1 K. Arabi and B. Kaminska "Oscillation-Test Strategy for Analog and Mixed-Signal Circuits," Proc. VLSI Test Symp., 1996, pp. 476-482.
2 K. Arabi and B. Kaminska, "Design for Testability of Integrated Operational Amplifiers Using Oscillation-Test Strategy," Proc. Int. Conf. Comput. Design, 1996, pp. 40-45.
3 K. Arabi and B. Kaminska, "Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method," IEEE Trans. Computer-Aided Design Integr. Circuits Syst., vol. 16, no. 7, 1997, pp. 745-753.   DOI   ScienceOn
4 G. Huertas et al., "Effective Oscillation-Based Test for Application to a DTMF Filter Bank," Proc. Int. Test Conf., 1999, pp. 549-555.
5 M. Santo Zarnik, F. Novak, and S. Macek, "Design of Oscillation-Based Test Structures for Active RC Filters," IEE Proc. Circuits Devices Syst., vol. 147, no. 5, 2000, pp. 297-302.   DOI   ScienceOn
6 P.M. Dias, J.E. Franca, and N. Paulino, "Oscillation Test Methodology for a Digitally-Programmable Switched-Current Biquad," Proc. IEEE Int. Mixed Signal Testing Workshop, 1996, pp. 221-226.
7 K. Arabi and B. Kaminska, "Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits," Proc. Int. Test Conf., 1997, pp. 786-795.
8 G. Huertas et al., "Oscillation-Based Test in Bandpass Oversampled A/D Converters," Microelectron. J., vol. 34, no. 10, 2003, pp. 927-936.   DOI   ScienceOn