Browse > Article
http://dx.doi.org/10.12673/jant.2020.24.4.314

Fault Detection through the LASAR Component modeling of PLD Devices  

Pyo, Dae-in (Department of Avionics engineering, Graduate School of Aeronautics, Information and Industry, Hanseo University)
Hong, Seung-beom (Department of Avionics engineering, Graduate School of Aeronautics, Information and Industry, Hanseo University)
Publication Information
Journal of Advanced Navigation Technology / v.24, no.4, 2020 , pp. 314-321 More about this Journal
Abstract
Logic automated stimulus and response (LASAR) software is an automatic test program development tool for logic function test and fault detection of avionics components digital circuit cards. LASAR software needs to the information for the logic circuit function and input and output of the device. If there is no component information, normal component modeling is impossible. In this paper, component modeling is carried out through reverse design of programmable logic device (PLD) device without element information. The developed LASAR program identified failure detection rates through fault simulation results and single-seated fault insertion methods. Fault detection rates have risen by 3% to 91% for existing limited modeling and 94% for modeling through the reverse design. Also, the 22 case of stuck fault with the I/O pin of EP310 PLD were detected 100% to confirm the good performance.
Keywords
Logic automated stimulus and response (LASAR); Component modeling; Programmable logic device (PLD); Joint electron device engineering council (JEDEC); Fault detection rate;
Citations & Related Records
연도 인용수 순위
  • Reference
1 J. W. Kim, A reliable maintenance method for electronic circuit card, M.S. dissertation, Korea University, Seoul, Korea, 2012.
2 Teradyne, LASAR software [Internet]. Available: http://www.teradynedefenseaerospace.com/products/software/lasar.
3 J. G. Jung, Fault detection system by extracting the ROM's data, M.S. dissertation, Hanseo University, Chungcheongnam-do, Korea, 2012.
4 W. J. Shim, A Study on the fault detection of ASIC using dynamic pattern test, M.S. dissertation, Hanseo University, Chungcheongnam-do, Korea, 2013.
5 Teradyne. Inc., LASAR 6.60 manual, 2007.
6 Wikipedia, Programmable logic device [Internet]. Available: https://en.wikipedia.org/wiki/pld.
7 DataSheet4U, Alter EP 310 [Internet]. Available: http://www.DataSheet4U.com/products/AlterEP310.
8 Wikipedia, Automatic test pattern generation [Internet]. Available:https://en.wikipedia.org/wiki/Automatic_test_pattern_generation.
9 MIL-STD-2077B, General requirement test program set, 1991.
10 S. W. Kim, Efficient diagnosis for multiple stuck-at faults using fault dictionary, M.S. dissertation, Yonsei University, Seoul, Korea, 2003.