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http://dx.doi.org/10.12673/jant.2019.23.1.69

Design of Microstrip Defected Ground Structure-based Sensor with Enhanced-Sensitivity for Permittivity Measurement  

Yeo, Junho (School of Computer and Communication Engineering/Information and Communication Research Center, Daegu University)
Lee, Jong-Ig (Division of Mechatronics Engineering, Dongseo University)
Abstract
In this paper, a design method for an enhanced-sensitivity microwave sensor based on microstrip defected ground structure was studied for the permittivity measurement of planar dielectric substrates. The proposed sensor was designed by modifying the ridge structure of an H-shaped aperture into the shape of a capacitor symbol. The sensitivity of the proposed sensor was compared with that of a conventional sensor based on a double-ring complementary split ring resonator(DR-CSRR). Two sensors were designed and fabricated on a 0.76-mm-thick RF-35 substrate so that the transmission coefficient would resonate at 1.5 GHz in the absence of the substrate under test. Five types of taconic substrates with a relative permittivity ranging from 2.17 to 10.2 were selected asthe substrate under test. Experiment results show that the sensitivity of the proposed sensor, which is measured by the shift in the resonant frequency of the transmission coefficient, is 1.31 to 1.62 times higher than that of the conventional DR-CSRR-based sensor.
Keywords
Enhanced-sensitivity; Capacitor-symbol shape; Defected ground structure; Microstrip line; Permittivity measurement;
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