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http://dx.doi.org/10.12673/jkoni.2013.17.5.560

A Study on the Fault Detection of ASIC using Dynamic Pattern Method  

Shim, Woo-Che (School of Avionics, Hanseo University)
Jung, Hae-Sung (Hankuk Communication Co. R&D Center)
Kang, Chang-Hun (Hankuk Communication Co. R&D Center)
Jie, Min-Seok (School of Avionics, Hanseo University)
Hong, Gyo-Young (School of Avionics, Hanseo University)
Ahn, Dong-Man (School of Avionics, Hanseo University)
Hong, Seung-Beom (School of Avionics, Hanseo University)
Publication Information
Journal of Advanced Navigation Technology / v.17, no.5, 2013 , pp. 560-567 More about this Journal
Abstract
In this paper, it is proposed the fault detection method of the ASIC, without the Test Requirement Document(TRD), extracting internal logic circuit and analyzed the function of the ASIC using the multipurpose development program and simulation. If there don't have the TRD, it is impossible to analyze the operation of the circuit and find out the fault detection in any chip. Therefore, we make the TRD based on the analyzed logic data of the ASIC, and diagnose of the ASIC circuit at the gate level through the signal control of I/O pins using the Dynamic Pattern signal. According to the experimental results of the proposed method, we is confirmed the good performance of the fault detection capabilities which applied to the non-memory circuit.
Keywords
TRD(Test Request Document); LASAR; ITA(Interface Test Adapter); ATE(Automatic Test Equipment); Fault Detection;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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