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http://dx.doi.org/10.14775/ksmpe.2018.17.6.111

Development of Optical Leveling System using Quarter Photodetector  

Kim, Byoung-Chang (School of Mechanical Engineering, Kyungnam UNIV.)
Publication Information
Journal of the Korean Society of Manufacturing Process Engineers / v.17, no.6, 2018 , pp. 111-116 More about this Journal
Abstract
Recently, shape manufacturing method has been changed to a 3D printer. Since lamination type manufacturing method is the basis for forming a three-dimensional shape by repeated lamination, the horizontal accuracy of the lamination layer is very important. In the current paper, we have proposed a new leveling system to be installed in a large 3D printer. The light source was reflected from the water surface contained in the measuring device, and the inclination of the measuring device was measured from the light that entered into four regions of a quarter photodetector. The electrical signals generated differently according to the position of the beam spot incident on the quarter photodetector was acquired and compensated to be horizontal by using a motor mounted at the corner. Compared to a digital leveler, the newly developed leveling system gave errors of only 2 to 3%. This new device can be applied to various fields including the 3D printer in future.
Keywords
Leveling System; Optical Device; Quarter Photodetector;
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Times Cited By KSCI : 2  (Citation Analysis)
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1 Chen, S. L, Hsiao, C. W., Chen, Y. H., Ko, J. D., Tzeng, C. M., Lin, J. R., Yu, S. P., "Wafer-leveled chip packaging structure and method thereof," Patent No. US7294920B2, 2007.
2 Hwang, I. H., Park, S. H., Ahn, K. J., Kwon, D. K., Lee, J. C., “A Study on Cutting Force during Multi Wire Sawing of Silicon Wafers for Solar Cells,” Journal of the Korean Society of Manufacturing Process Engineers, Vol. 15, No. 3, pp. 66-71, 2016.   DOI
3 Park, C. Y., Kweon, H. K., Peng, B., Jung, B. G., “A Study on New Twist-Diamond Wire Characteristics for Improving Processing Performance,” Journal of the Korean Society of Manufacturing Process Engineers, Vol. 15, No. 1, pp. 26-33, 2016.   DOI
4 Kim, B. C., Kim, S. W., “Absolute interferometer for three-dimensional profile measurement of rough surfaces,” Optics Letters, Vol. 28, No. 7, pp. 528-530, 2003.   DOI
5 Kim, B. C., Kim, S. W., “Multiple-pointdiffraction interferometer : Error Analysis and Calibration,” Korean Journal of Optics and Photonics, Vol. 16, No. 4, pp. 1-5, 2005.   DOI
6 Lee, J. W., Cho, M. W., Ha, S. J., Hong, K. P., Cho, Y. K., Kim, B. M., “Development of the Aspherical Lens Polishing System with MR Fluid and Analysis of the Basic Polishing Characteristic of MR Polishing System,” Journal of the Korean Society of Manufacturing Process Engineers, Vol. 13, No. 1, pp. 92-99, 2014.   DOI