1 |
O. Kwon, J. Wyant, Hayslett, "Rough surface interferometry at 10.6 ," Appl. Opt., vol.19, no.11, pp.1862-1866, 1980.
DOI
ScienceOn
|
2 |
K. Verma, B. Han, "Warpage Measurement on Dielectric Rough Surfaces of Microelectronics Devices by Far Infrared Fizeau Interferometry," Journal of Electronic Packaging, Vol. 122. No. 3, pp. 227-232, 2000.
DOI
|
3 |
B. Han, D. Post, P. lfju, "Moire interferometry for enginnering mechanics:current practices and future developments," Joural of Stain Analysis for Enginnering Design, Vol.36, No.1, pp.101-117, 2001.
DOI
|
4 |
B.C. Kim, S.W. Kim, "Absolute interferometer for three-dimensional profile measurement of rough surfaces," Optics Letters, Vol.28, No.7, pp.528-530, 2003.
DOI
ScienceOn
|
5 |
B.C. Kim, S.W. Kim, "Multiple-point-diffraction interferometer : Error Analysis and Calibration," Korean Journal of Optics and Photonics, Vol.16, No.4, pp.1-5, 2005.
DOI
|
6 |
Cezard Z. Janikow, Zbigniew Michalewicz, "A specialized genetic algorithm for numerical optimization problems," Proc 2 Int IEEE Conf Artif Intell, pp.798-783, 1990.
|