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http://dx.doi.org/10.5139/JKSAS.2012.40.12.1093

Reliability Evaluation of COTS Integrated Circuits for Military and Space Applications  

Chan, Sung-Il (Components & Materials Physics Research Center, Korea Electronics Technology Institute)
Han, Chang-Woon (Components & Materials Physics Research Center, Korea Electronics Technology Institute)
Publication Information
Journal of the Korean Society for Aeronautical & Space Sciences / v.40, no.12, 2012 , pp. 1093-1098 More about this Journal
Abstract
Commercial Off the Shelf(COTS) Integrated circuits(ICs) are being increasingly considered for use in space and military applications. Therefore, There is a need to implement standard tests and requirements to ensure reliability of COTS ICs. This paper presents an overview of the ICs screen procedure and methods under the European Cooperation for Space Standardization (ECSS) and Tests Method Standard Microcircuits (MIL-STD-883). We describes the COTS ICs screen test guidelines that are mainly focused after encapsulating. In addition, COTS linear bipolar IC is investigated to evaluate the reliability requirements. The experiment results showed that COTS IC is satisfied with high reliability requirements.
Keywords
COTS Parts; Integrated Circuit; Reliability Evaluation; Screening;
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