Browse > Article
http://dx.doi.org/10.1080/15980316.2011.567826

Liquid crystal alignment on patterned-alignment films  

Lias, Jais Bin (Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology)
Oo, Thet Naing (Institute for Materials Chemistry and Engineering, Kyushu University)
Yazawa, Tomohiro (Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology)
Kimura, Munehiro (Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology)
Akahane, Tadashi (Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology)
Publication Information
Abstract
To come up with a bistable liquid crystal (LC) device using unpolarized UV light, single-step laser patterning on a photoalignment layer using a photomask was proposed to achieve an equilibrium configuration of LC molecules in contact with a periodically patterned substrate. The patterns were formed by stripes of alternating random planar and homeotropic anchoring on a submicrometer scale in the order of $0.5{\mu}m$. Two possible configurations of bistable LC cells that can be obtained by combining a micropatterned surface formed with alternating random-planar- and homeotropic-alignment with planar- or homeotropic-alignment surfaces were proposed. The alignment properties of the two proposed models were investigated, along with the microscopic switching behavior of micropatterned nematic LC cells.
Keywords
bistable liquid crystal; random planar alignment; unpolarized UV light; switching behavior;
Citations & Related Records
연도 인용수 순위
  • Reference
1 P. Vetter, Y. Ohmura, and T. Uchida, Jpn. J. Appl. Phys. 32, L1239 (1993).   DOI
2 M. Kawasumi, N. Hasegawa, A. Usuki, and A. Okada, Liq. Cryst. 23, 769 (1996).
3 R. Kravchuk and O.Yaroshchuk, Mol. Cryst. Liq. Cryst. 422, 385 (2004).
4 I. Dozov and G. Durand, Liq. Cryst. Today 8, 1 (1998).
5 C. J. Gerritsma, J.A. Geurst, and A.M.J. Sprujit, Phys. Lett. 43A, 356 (1973).
6 S. Frunza, R. Moldovan, T. Beica, M. Giurgea, and D.N. Stoenescu, Europhys. Lett. 20, 407 (1992).   DOI   ScienceOn
7 M. Nobili, R. Barberi, and G. Durand, J. Phys. II France 5, 531 (1995).   DOI   ScienceOn
8 R. Karapinar, M. O'Neil, S.M. Kelly, A.W. Hall, and G.J. Owen, Springer-Verlag, ARI 51, 61 (1998).   DOI   ScienceOn
9 N. Tanaka, M. Kimura, and T. Akahane, Jpn. J. Appl. Phys. 44, 587 (2005).   DOI
10 D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972).   DOI
11 G.D. Boyd, J. Cheng, and P.D.T. Ngo, Appl. Phys. Lett. 36, 556 (1980).   DOI
12 D.W. Berreman and W.R. Heffner, J. Appl. Phys. 52, 3032 (1981).   DOI   ScienceOn
13 J.H. Kim, M. Yoneya, and H. Yokoyama, Appl. Phys. Lett. 78, 3055 (2001).   DOI   ScienceOn
14 M. O'Neill and S.M. Kelly, J. Phys. D 33, R67 (2000).   DOI   ScienceOn
15 T.Z. Qian and P. Sheng, Phys. Rev. Lett. 77, 4564 (1996).   DOI
16 M. Yoneya, J.H. Kim, and H. Yokoyama, Appl. Phys. Lett. 80, 374 (2002).   DOI   ScienceOn
17 B. Wen, J.H. Kim H. Yokoyama, and C. Rosenblatt, Phys. Rev. E 66, 41502 (2002).   DOI
18 T.N. Oo, R. Bansho, N. Tanaka, M. Kimura, and T. Akahane, Jpn. J. Appl. Phys. 45, 4176 (2006).   DOI
19 T.N. Oo, M. Kimura, and T. Akahane, in Proc. of the 13th Int. Display Workshops (IDW '06), 2006, p. 99.
20 T.N. Oo, Y. Yasu, M. Kimura, and T. Akahane, Abstr. of the Jpn. Liq. Cryst. Soc. Ann. Mtg., 2006, p. 287.
21 S. Sato and M. Wada, Jpn. J. Appl. Phys. 11, 1566 (1980).
22 T.N. Oo, Y. Yasu, M. Kimura, and T. Akahane, Phys. Rev. E 76, 31705-1 (2007).   DOI
23 T.N. Oo, M. Kimura, and T. Akahane, Adv. Tech. Mat. Mat. Proc. J. 10 (1), 9 (2008).
24 T. Yazawa, T.N. Oo, M. Kimura, and T. Akahane, in Proc. of the 14th Int. Display Workshops (IDW '07) (2007), p. 289.
25 J. Cheng and G. D. Boyd, Appl. Phys. Lett. 35, 444 (1979).   DOI
26 N. Koshida and S. Kikui, Appl. Phys. Lett. 40, 541 (1982).   DOI
27 T. Nose, S. Masuda, and S. Sato, Jpn. J. Appl. Phys. 30, 3450 (1991).   DOI
28 R. Yamaguchi and S. Sato, Jpn. J. Appl. Phys. 30, L616 (1991).   DOI