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Computational Integral Imaging with Enhanced Depth Sensitivity  

Baasantseren, Ganbat (School of Electrical & Computer Engineering, Chungbuk National University)
Park, Jae-Hyeung (School of Electrical & Computer Engineering, Chungbuk National University)
Kim, Nam (School of Electrical & Computer Engineering, Chungbuk National University)
Kwon, Ki-Chul (School of Electrical & Computer Engineering, Chungbuk National University)
Abstract
A novel computational integral imaging technique with enhanced depth sensitivity is proposed. For each lateral position at a given depth plane, the dissimilarity between corresponding pixels of the elemental images is measured and used as a suppressing factor for that position. The intensity values are aggregated to determine the correct depth plane of each plane object. The experimental and simulation results show that the reconstructed depth image on the incorrect depth plane is effectively suppressed, and that the depth image on the correct depth plane is reconstructed clearly without any noise. The correct depth plane is also exactly determined.
Keywords
CIIR; 3D image processing; depth detection;
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