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Comparison of Temporal Dark Image Sticking Produced by Face-to-Face and Coplanar Sustain Electrode Structures  

Kim, Jae-Hyun (School of Electrical Engineering and Computer Science, Kyungpook National University, Student Member, KIDS)
Park, Choon-Sang (School of Electrical Engineering and Computer Science, Kyungpook National University, Student Member, KIDS)
Kim, Bo-Sung (School of Electrical Engineering and Computer Science, Kyungpook National University, Student Member, KIDS)
Park, Ki-Hyung (School of Electrical Engineering and Computer Science, Kyungpook National University, Student Member, KIDS)
Tae, Heung-Sik (School of Electrical Engineering and Computer Science, Kyungpook National University, Member, KIDS)
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Abstract
The temporal dark image sticking phenomena are examined and compared for the two different electrode structures such as the face-to-face and coplanar sustain electrode structure. To compare the temporal dark image sticking phenomena for both structures, the differences in the infrared emission profile, luminance, and perceived luminance of the image sticking cells and the non image sticking cells were measured. It is observed that the temporal dark image sticking is mitigated for the face-to-face structure. The mitigation of the temporal dark image sticking for the face-to-face structure is due to the slight increase in the panel temperature induced by the ITO-less electrode structure.
Keywords
ac-PDP; temporal dark image sticking; face-to-face sustain electrode;
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