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An Organic Electrophosphorescent Device Driven by All-Organic Thin-Film Transistor using Polymeric Gate Insulator  

Pyo, S.W. (Dept. of Electrical Information & Control Eng., Hong-Ik Univ., Center for Organic Materials and Information Devices, Hong-IK Univ.)
Shim, J.H. (Research Institute of Sci. & Tech., Hong-IK Univ., Center for Organic Materials and Information Devices, Hong-IK Univ.)
Kim, Y.K. (Dept. of Chemical Eng., Hong-IK Univ., Center for Organic Materials and Information Devices, Hong-IK Univ.)
Abstract
In this paper, we demonstrate that the organic electrophosphorescent device is driven by the organic thin film transistor with spin-coated photoacryl gate insulator. It was found that electrical output characteristics in our organic thin film transistors using the staggered-inverted top-contact structure showed the non-saturated slope in the saturation region and the sub-threshold nonlinearity in the triode region, where we obtained the maximum power luminance that was about 90 $cd/m^2$. Field effect mobility, threshold voltage, and on-off current ratio in 0.45 ${\mu}m$ thick gate dielectric layer were 0.17 $cm^2/Vs$, -7 V, and $10^6$ , respectively. In order to form polyimide as a gate insulator, vapor deposition polymerization process was also introduced instead of spin-coating process, where polyimide film was co-deposited by high-vacuum thermal evaporation from 4,4'-oxydiphthalic anhydride (ODPA) and 4,4'-oxydianiline (ODA) and cured at 150${\sqsubset}$for 1hr. It was also found that field effect mobility, threshold voltage, on-off current ratio, and sub-threshold slope with 0.45 ${\mu}m$ thick gate dielectric films were 0.134 $cm^2/Vs$, -7 V, and $10^6$ A/A, and 1 V/decade, respectively.
Keywords
Organic electrophosphorescent device; organic thin film transistors; vapor deposition polymerization process;
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