1 |
H.H. Hsieh, H.H. Lu, H.C. Ting, C.S. Chuang, C.Y. Chen, and Y. Lin, J. Inf. Disp. 11, 160 (2010).
DOI
|
2 |
N. Gong, C. Park, J. Lee, I. Jeong, H. Han, J. Hwang, J. Park, K. Park, H. Jeong, Y. Ha, and Y. Hwang, Tech. Dig. SID 784 (2012).
|
3 |
E. Fortunato, P. Barquinha, and R. Martins, Adv. Mater. 24, 2945 (2012).
DOI
|
4 |
N. Morosawa, Y. Ohshima, M. Morooka, T. Arai, T. Sasaoka, J. SID 20, 47 (2012).
|
5 |
S.H. Choi and M.K. Han, IEEE Elec. Dev. Lett. 34, 771 (2013).
DOI
|
6 |
J.E. Pi, M.K. Ryu, C.S. Hwang, S.H. Yang, S.H.K. Park, S.M. Yoon, H.K. Leem, Y.K. Kim, J.D. Kim, H.S. Oh, and K.C. Park, IEEE Elec. Dev. Lett. 33, 1144 (2012).
DOI
|
7 |
K.C. Park, H.K. Leem, H.S. Oh, J.E. Pi, S.H.K. Park, Tech. Dig. SID 651 (2012).
|
8 |
S.Y. Kim, J.D. Kim, Y.K. Kim, H.K. Lym, J.T. Kim, H.S. Oh, J.E. Pi, M.K. Ryu, C.S. Hwang, S.H.K. Park, B.G. Yu, and K.C. Park, J. Dis. Tech. 9, 71 (2013).
DOI
|
9 |
B. Kim, C.I. Ryoo, S.J. Kim, J.U. Bae, H.S. Seo, C.D. Kim, and M.K. Han, IEEE Elec. Dev. Lett. 32, 158 (2011).
DOI
|
10 |
B. Kim, S.C. Choi, S.Y. Lee, S.H. Kuk, Y.H. Jang, C.D. Kim, and M.K. Han, IEEE Elec. Dev. Lett. 32, 1092 (2011).
DOI
|