1 |
D.Y. Choi, Y.S. Park, B.Y. Chung, B.H. Kim, S.S. Kim, SID '10 Digest, 802 (2010).
|
2 |
S.M. Choi, C.K. Kang, S.W. Chung, M.J. Kim, M.H. Kim, K.N. Kim, B.H. Kim, SID '10 Digest, 798 (2010)
|
3 |
K.Y. Lee, SID '11 Digest, 175 (2011).
|
4 |
T. Hasumi, S. Takasugi, K. Kanoh, and Y. Kobayashi, SID '06 Digest, 1547 (2006).
|
5 |
J.H. Lee, S.G. Park, J.H. Jeon, J.C. Goh, J.M. Huh, J. Choi, K. Chung, and M.K. Han, AMFPD 2006, 300 (2006).
|
6 |
C.W. Kim, J.G. Jung, J.B. Choi, D.H. Kim, C. Yi, H.D. Kim, Y.H. Choi, J. Im, SID '11 Digest, 862 (2011).
|
7 |
Y.J. Chang, J.H. Oh, S.H. Jin, S.H. Park, M.H. Choi, W.K. Lee, J.B. Choi, H.D. Kim, S.S. Kim, SID '11 Digest, 874 (2011).
|
8 |
H.D. Kim, J.K. Jeong, H.J. Chung, Y.G. Mo, SID '08 Digest, 291 (2008).
|
9 |
J.H. Choi, C. You, J. Choi, K. Cho, D. Kwon, H.D. Kim, S.S. Kim, SID '10 Digest, 1352 (2010).
|
10 |
T. Kamins, Polycrystalline Silicon for Integrated Circuits and Displays (1998).
|
11 |
K.C. Park, J.H. Jeon, Y.I. Kim, J.B. Choi, Y.J. Chang, Z.F. Zhan, C.W. Kim, Solid State Elect. 52, 1691 (2008).
DOI
|
12 |
M.H. Lee, S.M. Seop, J.S. Kim, J.H. Hwang, H.J. Shin, S.K. Cho, K.W. Min, W.K. Kwak, S.I. Jung, C.S. Kim, W.S. Choi, S.C. Kim, E.J. Yoo, SID '09 Digest, 802 (2009).
|
13 |
H.K. Chung, K.Y. Lee, SID '05 Digest, 956 (2005).
|
14 |
I. Lee, C. Im, Y. Kim, D. Kwon, J. Kim, M. Ko, J. Yun, J. Yeo, J. Im, S. Kim, SID '11 Digest, 101 (2011).
|
15 |
이호년, 한국정보디스플레이학회지 7 (2), 10 (2006).
|
16 |
Coherent Product Catalog, Excimer Lasers.UV Optical Systems (2011).
|
17 |
J.B. Choi, Y.J. Chang, C.H. Park, Y.I. Kim, J.H. Eom, H.D. Na, I.D. Chung, S.H. Jin, Y.R. Song, B. Choi, H.S. Kim. K. Park, C.W. Kim, J.H. Souk, Y. Kim, B. Jung, K.C. Park, SID '08 Digest, 97 (2008).
|
18 |
J.B. Choi, C.H. Park, I.D. Chung, K.H. Lee, H.K. Min, C.W. Kim, S.S. Kim, SID '09 Digest, 88 (2009).
|
19 |
S.H. Jung, H.K. Lee, C.Y. Kim, S.Y. Yoon, C.D. Kim, I.B. Kang, SID '08 Digest, 101 (2008).
|
20 |
H.S. Seo, C.D. Kim, I.B. Kang, I.J. Chung, M.C. Jeong, J.M. Myoung, D.H. Shin, J. of Cryst. Growth, 310, 5317 (2008).
DOI
|