A study on a Prediction of Dangerous Failure Rate in the Embedded System for the Track Side Functional Module

This study presents a prediction of a failure rate in a safety required system that consists of a embedded control system, requiring a satisfaction of a quantitative safety requirement. International Standards are employed to achieve a regular procedures in the whole life cycle of a system, for the purpose of a prediction and a evaluation of a fault that might be able to be happened in a system. This International Standards uses SIL (Safety Integrity Level) to evaluate a safety level of a system. SIL is divided into 4 levels, from level 1 to level 4, and each level has functional failure rate and dangerous failure rate of a system. In this paper we describe the conventional method to predict the dangerous failure rate and propose a method using hazard analysis to predict the dangerous failure rate. The conventional method and the technique using hazard analysis to predict the dangerous failure rate are made a comparison through the control modules of the interlocking system in KTX. The proposed method verify better effectiveness for the prediction of the dangerous failure rate than that of the conventional method.

TFM에 대한 내장형제어기의 위험측고장률 예측에 관한 연구