1 |
Z.J.Pei, Graham R. Fisher, and J. Liu., Inter. J. of Machine Tools & Manufacture 39, 1103 (1999).
DOI
ScienceOn
|
2 |
S. M. Lee, S. M. Sim, Y. W. Chung, Y. K. Jang, and H. K. Cho., Jpn. J. Appl. Phys. 36, 3374 (1997).
DOI
|
3 |
J.D. Wu, C.Y. Huang, and C.C. Lio., Microelectronics Reliability 43, 269 (2003).
DOI
ScienceOn
|
4 |
Ruben Perez and Peter Gumbsch, Physical Review Letter 84, 5347 (2000).
DOI
ScienceOn
|
5 |
Dov Sherman and Ilan Be'ery, J. of Mechanics and Physics of Solids 52, 1743 (2004).
DOI
ScienceOn
|
6 |
X. Li, T. Kasai, S. Nakao, T. Ando, M. Shikida, K. Sato, and H. Tanaka, Sensors and Actuators A 117, 143 (2005).
DOI
ScienceOn
|
7 |
Z.J.Pei, Graham R. Fisher, and J. Liu. Inter. J. of Machine Tools & Manufacture 48, 1297 (2008).
DOI
ScienceOn
|