Microstructure Analysis of Fe Thin Films Prepared by Ion Beam Deposition
![]() ![]() ![]() |
Kim, Ka Hee
(Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center)
Yang, Jun-Mo (Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center) Ahn, Chi Won (Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center) Seo, Hyun Sang (Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center) Kang, Il-Suk (Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center) Hwang, Wook-Jung (Advanced Technology Center for Information Electronic Materials and Components, National Nanofab Center) |
1 | J.-W. Lim and M. Isshiki, J. Kor. Vac. Soc. 12, 136 (2003) |
2 | K. Ohashi and K. Miyake, Mater. Chem. Phys. 54, 365 (1998) DOI ScienceOn |
3 | J. Islam, Y. Yamamoto, E. Shikoh, A. Fujiwara, and H. Hori, J. Magn. Magn. Mater. 320, 571 (2008) DOI ScienceOn |
4 | Y. Bohne, D. M. Seeger, C. Blawert, W. Dietzel, S. Mandl, and B. Rauschenbach, Surf. Coat. Tech. 200, 6527 (2006) DOI ScienceOn |
5 | J. S. Song, S. Y. Kim, J. H. Lee, and I. S. Lee, J. Kor. Inst. Met. & Mater. 37, 225 (1999) |
6 | J.-W. Lim, K. Miyake, and M. Isshikia, Thin Solid Films 434, 34 (2003) DOI ScienceOn |
7 | S. M. Liu, D. C. Li, W. T. Hu, G. Q. Qin, and L. F. Li, J. Non-Cryst. Solids 354, 1444 (2008) DOI ScienceOn |
8 | K. Miyake and K. Ohashi, Mater. Chem. Phys. 54, 321 (1998) DOI ScienceOn |
9 | D. Shindo and K. Hiraga, High-Resolution Electron Microscopy for Materials Science, Springer, Tokyo (1999) |
10 | K. H. Lee, J. Kor. Inst. Met. & Mater. 31, 7 (1993) |
11 | M. Sasase, K. Shimura, K. Yamaguchi, H. Yamamoto, S. Shamoto, and K. Hojou, Nucl. Instrum. Meth. B 257, 186 (2007) |
12 | J.-W. Lim, K. Mimura, K. Miyake, M. Yamashita, and M. Isshiki, Thin Solid Films 434, 30 (2003) DOI ScienceOn |
13 | C. C. Kuo, C. C. Liu, C. C. Lin, Y. Y. Liou, Y. F. Lan, and J. L. He, Vacuum 82, 441 (2008) DOI ScienceOn |
14 | M. Cougo dos Santos, J. Geshev, J. E. Schmidt, S. R. Teixeira, and L. G. Pereira, Phys. Rev. B 61, 1311 (2000) |
15 | Xiaoling Cheng, Shejun Hu, Peng Zeng, Tongchun Kuang, Guangrong Xie, and Feng Gao, Surf. Coat. Tech. 201, 5552 (2007) DOI ScienceOn |
16 | K. Miyake and K. Ohashi, Jpn. J. Appl. Phys. 32, 120 (1993) DOI ScienceOn |
![]() |