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http://dx.doi.org/10.9766/KIMST.2017.20.4.536

Localization Developments on Electric Igniter for Thermal Battery of a Missile on K-PSAM  

Ahn, Mahn-Ki (Missile Electronics Center, Defense Agency for Technology and Quality)
Jeon, Jae-Hyun (Missile Electronics Center, Defense Agency for Technology and Quality)
Ahn, Gil-hwan (Energetic Materials & Pyrotechics Team, Hanwha Co,. Ltd.)
Lee, Seung-Young (New Product Development Team, Vitzromiltech Co,. Ltd.)
Publication Information
Journal of the Korea Institute of Military Science and Technology / v.20, no.4, 2017 , pp. 536-542 More about this Journal
Abstract
In this paper, authors described on localization development's results about an electric igniter in thermal battery with a pyrotechnic heat sources. Especially, the development test and evaluation(DT&E) process and the methods in the developments of the electric igniter which is parts of a domestic thermal battery on K-PSAM was in charge of government and developed for defense of a local areas in Korea. We have proposed a process of design and manufacture on the electric igniter. Finally, we verified a quality and a reliability of the electric igniter from test results by Fisher-Snedecor's law and over 99.5 %(C.L. 95 %) for K-PSAM.
Keywords
Electric Igniter; Thermal Battery; Localization Development; Reliability; One-shot Items;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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1 David Linden, "Handbook of Batteries," Second Edition, McGraw-Hill, 1994.
2 M. Ahn, S. Lee, Y. Ko, T. Lee, W. Whang, Y. Whang, "Strategies for Development in the Localization on Thermal Battery," KIMST Annual Conference Proceedings, Page 234. 2011.
3 S. Back, Y. Sin, S. Lee, M. Ahn, C. Kim, “Single Sample Grouping Methodology using Combining Date,” Journal of the Korea Institute of Military Science and Technology, Vol. 17, No. 5, pp. 1-9, 2014.   DOI
4 M. Ahn, I. Jang, "Strategy for the Regulation of Reliability on Igniter in Thermal Battery for Missiles," KIMST Annual Conference Proceedings, Page 154. 2015.
5 Sherwin, E. R., "Analysis of One-Shot Devices," Selected Topics in Assurance Related Technologies, Reliability Analysis Center(RAC), Vol. 7, #4.
6 Huairui Guo, Honecker. S, Mettas. A, Ogden. D, "Reliability Estimation for One-Shot Systems with Zero Component Test Failures," RAMS2010, pp. 1-7, 2010.
7 Craig J. willits, Dennis C. Dietz, Albert H. Moore, “Series-System Reliability-Estimation Using Very Small Binomial Samples,” IEEE Transactions on Reliability, Vol. 46, No. 2, pp. 296-302, 1997.   DOI