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http://dx.doi.org/10.9766/KIMST.2012.15.2.111

Improvements in Design and Evaluation of Built-In-Test System  

Heo, Wan-Ok (LIG넥스원(주))
Park, Eun-Shim (LIG넥스원(주))
Yoon, Jung-Hwan (LIG넥스원(주))
Publication Information
Journal of the Korea Institute of Military Science and Technology / v.15, no.2, 2012 , pp. 111-120 More about this Journal
Abstract
Built-In-Test is a design feature in more and more advanced weapon system. During development test and evaluation(DT&E) it is critical that the BIT system be evaluated. The BIT system is an integral part of the weapon system and subsystem. Built-In-Test assists in conducting on system and subsystem failure detection and isolation to the Line Replaceable Unit(LRU). This capability reduces the need for highly skilled personnel and special test equipment at organizational level, and reduces maintenance down-time of system by shortening Total Corrective Maintenance Time. During DT&E of weapon system the objective of BIT system evaluation is to determine BIT capabilities achieved and to identify deficiencies in the BIT system. As a result corrective actions are implemented while the system is still in development. Through the use of the reiterative BIT evaluation the BIT system design was corrected, improved, or updated, as the BIT system matured.
Keywords
Built-In-Test; Fault Detection Rate/Fraction of Faults Detectable; Fault Isolation Rate; False Alarm Rate;
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