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http://dx.doi.org/10.7776/ASK.2007.26.2.095

Development of a Thickness Mode Piezoelectric Oscillator Sensor to Detect Damages in a Structure  

Kim, Dong-Young (경북대학교 센서공학과)
Roh, Yong-Rae (경북대학교 기계공학과)
Publication Information
The Journal of the Acoustical Society of Korea / v.26, no.2, 2007 , pp. 95-101 More about this Journal
Abstract
This paper presents the feasibilityof a thickness mode piezoelectric oscillator to detect damages in structures. The thickness mode oscillator sensor is composed of an electronic feedback oscillator circuit and a piezoelectric thickness mode vibrator to be attached to a structure of interest. Damage to the structure causes a change in the impedance spectrum of the structure, which results in a corresponding change of a resonant frequency of the structure. The oscillator sensor can instantly detect the frequency change in a very simple manner. Feasibility of the piezoelectric oscillator sensor was verified with a sample aluminum plate where artificial cracks of different lengths and number were imposed in sequence. Validity of the measurement was confirmed through comparison of the experimental data with the results of finite element analyses of a plate with cracks.
Keywords
Piezoelectric sensor; Oscillator; Civil infrastructure; Impedance; FEM;
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