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A Study on Estimation of Technology Life Span Using Analysis of Patent Citation  

Yoo, Sun-Hi (한국과학기술정보연구원 혁신인프라전략팀)
Lee, Yong-Ho (한국과학기술정보연구원 혁신인프라전략팀)
Won, Dong-Kyu (한국과학기술정보연구원 혁신인프라전략팀)
Publication Information
Journal of the Korean Operations Research and Management Science Society / v.31, no.4, 2006 , pp. 1-11 More about this Journal
Abstract
A citation-based method of estimating the life span of a patented technology is proposed In this study. The suggested framework Includes : (1) estimation of citation frequency of an individual patent within a technology group. (2) calculation of a mutual citation frequency between citing patent and cited patents, (3) calculation of the period for cited patents from the year of registration to the year of being cited most recently and (4) description for technology group using descriptive statistics such as mean, median, mode, etc. The framework suggested in this study was applied to the US patent data between 1976 and 2004 for 5 communications areas.
Keywords
Life Span of Technology; Depreciation Rate of Technology; Technology Life Cycle; Citation Analysis; Valuation of Technology;
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