High quality SiC single crystal growth by using NbC-coated crucible |
Kim, Jeong-Hui
(Department of Advanced Materials Engineering, Dong-Eui University)
Kim, Woo-Yeon (Department of Advanced Materials Engineering, Dong-Eui University) Park, Mi-Seon (Department of Advanced Materials Engineering, Dong-Eui University) Jang, Yeon-Suk (Department of Advanced Materials Engineering, Dong-Eui University) Lee, Won-Jae (Department of Advanced Materials Engineering, Dong-Eui University) |
1 | S. Ji, Z. Zhang and F. Wang, "Overview of high voltage SiC power semiconductor devices: Development and application", IEEE Xplore. 1 (2017) 254. |
2 | J. Millan, P. Godignon, X. Perpina, A. Perez-Tomas and J. Rebollo, "A survey of wide bandgap power semiconductor devices", IEEE Xplore. 29 (2013) 2155. |
3 | J. Biela, M. Schweizer, S. Waffler and J.W. Kolar, "SiC versus Si-Evaluation of potentials for performance improvement of inverter and DC-DC converter systems by SiC power semiconductors", IEEE Xplore. 58 (2010) 2872. |
4 | Y.J. Shin, W.J. Kim, J.H. Moon and W. Bahng, "Characterization of dislocations in 4H-SiC epitaxy using molten-KOH etching", J. Korean Inst. Electr. Electron. Mater. Eng. 24 (2011) 779. DOI |
5 | P.G. Neudeck, "Electrical impact of SiC structural crystal defects on high electric field devices", Mat. Sci. Forum 338 (2000) 1161. |
6 | W. Fan, H. Qu, S.I. Chang, B. Kozak, G. Shaffer, A. Galyukov and W.J. Lee, "Impacts of TaC coating on SiC PVT process control and crystal quality", Mat. Sci. Forum 963 (2019) 22. |
7 | J.M. Choi, C.Y. Lee, D.S. Kim, M.S. Park, Y.S. Jang, W.J. Lee and X.G. Xu, "New materials for semi-insulating SiC single crystal growth by PVT method", Mat. Sci. Forum 963 (2019) 46. |
8 | H.I. Helava, E.N. Mokhov, O.A. Avdeev, M.G. Ramm, D.P. Litvin, A.V. Vasiliev and Y.N. Makarov, "Growth of low-defect SiC and AlN crystals in refractory metal crucibles", Mat. Sci. Forum 740 (2013) 85. |
9 | Y.Z. Yao, Y. Ishikawa, Y. Sugawara, H. Saitoh, K. Danno, H. Suzuki and N. Shibata, "Molten KOH etching with Na2O2 additive for dislocation revelation in 4H-SiC epilayers and substrates", Japanese J. Appl. Phys. 50 (2011) 075502. DOI |
10 | B. Liu, J.H. Edgar, Z. Gu, D. Zhuang, B. Raghothamachar, M. Dudley and H.M. Meyer III, "The durability of various crucible materials for aluminum nitride crystal growth by sublimation", MRS Internet J. Nitride Semicond. Res. 9 (2004) 6. |
11 | S.I. Nakashima and H. Harima, "Raman investigation of SiC polytypes", Physica Status Solidi (a) 162 (1997) 39. DOI |
12 | S.Y. Karpov, Y.N. Makarov and M.S. Ramm, "Simulation of sublimation growth of SiC single crystals", Physica Status Solidi (b) 202 (1997) 201. DOI |
13 | D. Hofmann, M. Bickermann, R. Eckstein, M. Kolbl, S. Muller, E. Schmitt and A. Winnacker, "Sublimation growth of silicon carbide bulk crystals: experimental and theoretical studies on defect formation and growth rate augmentation", J. Cryst. Growth. 198-199 (1999) 1005. DOI |