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http://dx.doi.org/10.6111/JKCGCT.2020.30.5.183

Electrical properties of PZN-PZT thick films formed by aerosol deposition process  

Tungalaltamir, Ochirkhuyag (Department of Materials Science and Engineering, Pukyong National University)
Jang, Joo-Hee (Department of Materials Science and Engineering, Pukyong National University)
Park, Yoon-Soo (Department of Materials Science and Engineering, Pukyong National University)
Park, Dong-Soo (Functional Materials Group, Korea Institute of Machinery and Materials)
Park, Chan (Department of Materials Science and Engineering, Pukyong National University)
Publication Information
Journal of the Korean Crystal Growth and Crystal Technology / v.30, no.5, 2020 , pp. 183-188 More about this Journal
Abstract
Lead zinc niobate (PZN)-added lead zirconate titanate (PZT) thick films with thickness of 5~10 ㎛ were fabricated on silicon and sapphire substrates using aerosol deposition method. The contents of PZN were varied from 0 %, 20 % and to 40 %. The PZN-added PZT film showed poorer electrical properties than pure PZT film when the films were coated on silicon substrate and annealed at 700℃. On the other hand, the PZN-added PZT film showed higher remanent polarization and dielectric constant values than pure PZT film when the films were coated on sapphire and annealed at 900℃. The ferroelectric and dielectric characteristics of 20 % PZN-added PZT films annealed at 900℃ were compared with the result values obtained from bulk ceramic specimen with same composition sintered at 1200℃. As annealing temperature increased, dielectric constant increased. These came from enhanced crystallization and grain growth by post heat treatment.
Keywords
PZN; PZT; Relaxor; Aerosol-deposition process; Electrical properties;
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Times Cited By KSCI : 2  (Citation Analysis)
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