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http://dx.doi.org/10.6111/JKCGCT.2014.24.6.246

Effect of oxygen concentration and oxygen precipitation of the single crystalline wafer on solar cell efficiency  

Lee, Song Hee (Woongjin Energy Co., Ltd.)
Kim, Sungtae (Woongjin Energy Co., Ltd.)
Oh, Byoung Jin (Woongjin Energy Co., Ltd.)
Cho, Yongrae (Woongjin Energy Co., Ltd.)
Baek, Sungsun (Woongjin Energy Co., Ltd.)
Yook, Youngjin (Woongjin Energy Co., Ltd.)
Publication Information
Journal of the Korean Crystal Growth and Crystal Technology / v.24, no.6, 2014 , pp. 246-251 More about this Journal
Abstract
Recent studies have shown methods of improving solar cell efficiency. Especially on single crystalline silicon wafer which is high-efficiency solar cell material that has been widely studied. Interstitial oxygen (Oi) is the main impurity in the Czochralski (Cz) growing method, and excess of this can form precipitates during cell fabrication. We have demonstrated the effect of Oi impurity and oxygen precipitation concentration of the wafer on Cz-silicon solar cell efficiency. The result showed a decrease in cell efficiency as Oi and oxygen precipitation increase. Moreover, we have found that the critical point of [Oi] to bring higher cell efficiency is at 14.5 ppma in non-existent Bulk Micro Defect (BMD).
Keywords
Solar cells; Efficiency; Czochralski silicon; Oxygen precipitation; BMD;
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