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http://dx.doi.org/10.6111/JKCGCT.2013.23.4.161

Effect of metal buffer layers on the growth of GaN on Si substrates  

Lee, Jun Hyeong (Department of Applied Sciences, Korea Maritime University)
Yu, Yeon Su (Department of Applied Sciences, Korea Maritime University)
Ahn, Hyung Soo (Department of Applied Sciences, Korea Maritime University)
Yu, Young Moon (Korea LED-Marine Convergence Technology R&D Center, Pukyong National University)
Yang, Min (Department of Applied Sciences, Korea Maritime University)
Abstract
AlN buffer layers have been used for the growth of GaN layers on Si substrates. However, the doping of high concentration of carriers into AlN layers is still not easy, therefore it may cause the increase of series resistance when it is used for the electrical or optical devices. In this work, to improve such a problem, the growth of GaN layers on Si substrates were performed using metal buffer layers instead of AlN buffer layer. We tried combinations of Ti, Al, Cr and Au as metal buffer layers for the growth of GaN on Si substrates. Surface morphology was measured by optical microscope and scanning electron microscope (SEM), and optical properties and crystalline quality were measured by photoluminescence (PL) and X-ray diffractometer (XRD), respectively. Electrical resistances for both cases of AlN and metal buffer layer were compared by current-voltage (I-V) measurement.
Keywords
GaN; Buffer layer; AlN buffer layer; Si; Melt-back etching; Metal buffer layer; MOCVD;
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