Multiple accelerated degradation test and failure analysis for MLCCs |
Kim, Jung-Woo
(School of Material Science and Engineering, Pusan University)
Kim, Jin-Seong (School of Material Science and Engineering, Pusan University) Lee, Hee-Soo (School of Material Science and Engineering, Pusan University) Kang, Do-Won (LCR Division, Samsung Electro-mechanics Co. Ltd.) Kim, Jeong-Wook (LCR Division, Samsung Electro-mechanics Co. Ltd.) |
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