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Characterization of transparent ATO conducting films prepared by RF magnetron sputtering  

Lee, Sung-Uk (School of Information and Communication Engineering, Sungkyunkwan University)
Park, Yong-Seob (School of Information and Communication Engineering, Sungkyunkwan University)
Hong, Byung-You (School of Information and Communication Engineering, Sungkyunkwan University)
Abstract
In this study, we synthesized ATO films using RF magnetron sputtering method consisted of $SnO_2$ target added Sb of 6 wt% and investigated the effect of $O_2$ on structural, electrical, and optical properties of ATO films. As a result, in case of $O_2$/Ar ratio of 0.11, we obtained ATO films exhibit the properties such as the resistivity about $8{\times}10^{-3}[{\Omega}-cm]$, the transmittance of 85.17%, and retile structure.
Keywords
ATO; Sputtering; Crystallization; Resistivity; Transmittance; Optical band gap; Surface roughness;
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