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HVPE growth of GaN/InGaN heterostructure on r-plane sapphire substrate  

Jeon, H.S. (Department of Applied Sciences, Korea Maritime University)
Hwang, S.L. (Department of Applied Sciences, Korea Maritime University)
Kim, K.H. (Department of Applied Sciences, Korea Maritime University)
Jang, K.S. (Department of Applied Sciences, Korea Maritime University)
Lee, C.H. (Department of Applied Sciences, Korea Maritime University)
Yang, M. (Department of Applied Sciences, Korea Maritime University)
Ahn, H.S. (Department of Applied Sciences, Korea Maritime University)
Kim, S.W. (Department of Physics, Andong National University)
Jang, S.H. (Samsung Electro-Mechanics Co., Ltd.)
Lee, S.M. (Samsung Electro-Mechanics Co., Ltd.)
Park, G.H. (Samsung Electro-Mechanics Co., Ltd.)
Koike, M. (Samsung Electro-Mechanics Co., Ltd.)
Abstract
The a-plane GaN layer on r-plane $Al_2O_3$ substrate is grown by mixed-source hydride vapor phase epitaxy (HVPE). The GaN/InGaN heterostructure is performed by selective area growth (SAG) method. The heterostructure consists of a flown over mixed-sourec are used as gallium (or indium) and nitrogen sources. The gas flow rates of HCl and $NH_3$ are maintained at 10 sccm and 500 sccm, respectively. The temperatures of GaN source zone is $650^{\circ}C$. In case of InGaN, the temperature of source zone is $900^{\circ}C$. The grown temperatures of GaN and InGaN layer are $820^{\circ}C\;and\;850^{\circ}C$, respectively. The EL (electroluminescence) peak of GaN/InGaN heterostructure is at nearly 460 nm and the FWHM (full width at half maximum) is 0.67 eV. These results are demonstrated that the heterostructure of III-nitrides on r-plane sapphire can be successfully grown by mixed-source HVPE with multi-sliding boat system.
Keywords
HVPE; R-plane sapphire; Heterostructure; a-plane GaN; Multi-sliding boat; Mixed-source;
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